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Scanning electron microscopy (SEM) is a microscopy technique in which a beam of electrons are directed at a specimen of interest. The electron beam interacts with the specimen generating a number of secondary emissions. An SEM provides the ability for high resolution surface imaging with a long depth of field images to be acquired. Our FEG-SEM’s have Energy Dispersive Spectroscopy (EDS) detectors and Electron backscatter diffraction (EBSD) cameras. We also have a STEM detector on the Jeol 7200.

A FEG-SEM is an indispensable analytical tool for research and solving industrial problems where optical microscopes will not provide the required resolution.

Samples can be viewed coated in carbon or gold, or uncoated. Maximum sample size 150 mm by 150 mm.